Characterization of limit cycle oscillations induced by Fixed Threshold Samplers

In this work, a generalized study of the conditions for appearance limit cycle oscillations induced by any kind sampler with multilevel fixed thresholds is presented. These kinds samplers, which will be referred to as Fixed Threshold Samplers (FTS), are characterized series parameters, which, when selected properly, allow obtaining some most used forms quantization in Event-Based Control (EBC). Because characteristics, obtained can present bias, therefore, characterize them Dual Input Describing Function (DIDF) method used. The DIDF analyzed revealing interesting properties allowing simplify robustness analysis. analysis takes into account effect disturbance and reference signal influence on system, generally overlooked DF Guidelines about how perform given, showing their application through cases.